An integrated exposure and measurement tool for 5-DOF direct laser writing based on chromatic differential confocal sensing

Accurate and uniform fabrication of microstructures on highly curved substrates requires exposure with the waist of a focused laser beam at every point. In order to realize this, the exposure beam must be held perpendicular and focused onto the local substrate. Here we present an optical tool for ou...

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Bibliographic Details
Main Authors: Belkner Johannes, Leineweber Johannes, Hein Georg, Stauffenberg Jaqueline, Barth Alexander, Kissinger Thomas, Manske Eberhard, Fröhlich Thomas
Format: Article
Language:English
Published: EDP Sciences 2025-01-01
Series:Journal of the European Optical Society-Rapid Publications
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Online Access:https://jeos.edpsciences.org/articles/jeos/full_html/2025/01/jeos20250010/jeos20250010.html
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