DRR-YOLO: A Study of Small Target Multi-Modal Defect Detection for Multiple Types of Insulators Based on Large Convolution Kernel
The existing insulator defect detection algorithms are mainly characterized by their ability to identify only a single type of defect, accompanied by relatively low accuracy, a Dilated Re-parameterized Residual-YOLO (DRR-YOLO) algorithm is proposed, which is capable of identifying four defects of ea...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10877729/ |
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