Essential Frequency Analysis for Stacked Cu-CNT Composite Cells of TSVs

This paper presents a comprehensive frequency analysis of copper-carbon nanotube (Cu-CNT) composite cells in stacked through-silicon vias (TSVs), focusing on a novel approach in which Cu-CNT composite cells are distributed normally within the TSVs. This distribution is designed to simulate real-worl...

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Bibliographic Details
Main Authors: Mekala Girish Kumar, Yash Agrawal, Harish Pulluri, Rohit Sharma
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10909535/
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