Amato, U., Antoniadis, A., Feis, I. D., Doinychko, A., Gijbels, I., Magna, A. L., . . . Vasquez, P. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. MDPI AG.
Chicago Style (17th ed.) CitationAmato, Umberto, et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. MDPI AG.
MLA (9th ed.) CitationAmato, Umberto, et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. MDPI AG.
Warning: These citations may not always be 100% accurate.