Moon, K. C., Im, H., Yun, G., Kim, H., Na, J., Kim, C., & Kim, Y. Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics. Taylor & Francis Group.
Chicago Style (17th ed.) CitationMoon, Kook Chul, Hwarim Im, Gyohyeok Yun, Hyoungsik Kim, JungUn Na, Changhwan Kim, and Yong-Sang Kim. Novel Electrical Characteristic Measurement System of Semiconductor Films for Estimating Device Characteristics. Taylor & Francis Group.
MLA (9th ed.) CitationMoon, Kook Chul, et al. Novel Electrical Characteristic Measurement System of Semiconductor Films for Estimating Device Characteristics. Taylor & Francis Group.
Warning: These citations may not always be 100% accurate.