Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics
We proposed a novel measurement method and system to measure the electrical characteristics of non-patterned semiconductor films to estimate the final device’s properties. The proposed method is based on measuring bottom-gate structure thin-film transistor (TFT) using the probe pins as source and dr...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2025-04-01
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| Series: | Journal of Information Display |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/15980316.2024.2417923 |
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