Kim, H., & Tohmyoh, H. Acoustic resonant imaging technique for characterization ofphotoresist properties depending on hard bake temperature. NDT.net.
Chicago Style (17th ed.) CitationKim, Hyelin, and Hironori Tohmyoh. Acoustic Resonant Imaging Technique for Characterization Ofphotoresist Properties Depending on Hard Bake Temperature. NDT.net.
MLA (9th ed.) CitationKim, Hyelin, and Hironori Tohmyoh. Acoustic Resonant Imaging Technique for Characterization Ofphotoresist Properties Depending on Hard Bake Temperature. NDT.net.
Warning: These citations may not always be 100% accurate.