Determination of the XUV Frequency Chirp at the Free-Electron Laser FLASH via THz Streaking and Electron Beam Diagnostics

Determination of the XUV Frequency Chirp at the Free-Electron Laser FLASH via THz Streaking and Electron Beam Diagnostics

Free-electron lasers (FELs) operating in the extreme ultraviolet (XUV) and X-ray regions deliver ultrashort pulses with unprecedented intensity, enabling groundbreaking research across various scientific disciplines. A potential chirp (frequency change within the pulse) of these pulses influences th...

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Bibliographic Details
Main Authors: Mahdi M. Bidhendi, Gesa Goetzke, Ivette J. Bermudez Macias, Rosen Ivanov, Evgeny A. Schneidmiller, Najmeh Mirian, Stefan Düsterer
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Photonics
Subjects:
free-electron lasers
temporal diagnostic
XUV pulses
SASE
THz streaking
Online Access:https://www.mdpi.com/2304-6732/11/12/1153
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