Microsphere-assistance in conventional, interference and confocal microscopy – modeling and experimental results

Topographical as well as microscopic imaging of nanoscale surfaces plays a pivotal role across various disciplines. Nevertheless, achieving fast, label-free, and accurate characterization of laterally expanded structures below the diffraction limit remains challenging. Recent studies highlight the u...

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Bibliographic Details
Main Authors: Hüser Lucie, Pahl Tobias, Hagemeier Sebastian, Eckhardt Tim, Rosenthal Felix, Diehl Michael, Lehmann Peter
Format: Article
Language:English
Published: EDP Sciences 2025-01-01
Series:Journal of the European Optical Society-Rapid Publications
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Online Access:https://jeos.edpsciences.org/articles/jeos/full_html/2025/01/jeos20240081/jeos20240081.html
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