Performance Analysis of Rare-Earth Doped Oxide Thin-Film Transistors Using Neural Network Method
The work analyzes the key impact factors on the performances of rare-earth element doped oxide thin-film transistors (TFTs), which are potentially used for high performance displays, by comparatively using a Bayesian Neural Network (BNN) method and Artificial Neural Network (ANN) method based on pub...
Saved in:
| Main Authors: | , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10909085/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Be the first to leave a comment!