Performance Analysis of Rare-Earth Doped Oxide Thin-Film Transistors Using Neural Network Method

Performance Analysis of Rare-Earth Doped Oxide Thin-Film Transistors Using Neural Network Method

The work analyzes the key impact factors on the performances of rare-earth element doped oxide thin-film transistors (TFTs), which are potentially used for high performance displays, by comparatively using a Bayesian Neural Network (BNN) method and Artificial Neural Network (ANN) method based on pub...

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Bibliographic Details
Main Authors: Zengyi Peng, Xianglan Huang, Yuanyi Shen, Weijing Wu, Min Li, Miao Xu, Lei Wang, Zhenghui Gu, Zhuliang Yu, Junbiao Peng
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Thin-film transistors (TFT) for displays
machine learning (ML)
neural network (NN)
Online Access:https://ieeexplore.ieee.org/document/10909085/
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