A DEVICE FOR MEASURING THE SURFACE RESISTANCE OF TRANSPARENT CONDUCTIVE OXIDES BY THE FOUR-PROBE METHOD
Background. Transparent conducting oxides, such as indium tin oxide (ITO) and aluminum-doped zinc oxide (AZO), are essential materials for various electronic applications, including solar cells, displays, and sensors. Accurate measurement of their surface resistance is critical for evaluating the qu...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penza State University Publishing House
2025-06-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
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