Establishing topological benchmarks for three-dimensional x-ray diffraction microscopy

Establishing topological benchmarks for three-dimensional x-ray diffraction microscopy

A quantitative characterization of 3D topology is paramount for understanding microstructure and its time-evolution. This Perspective establishes a framework to evaluate the accuracy of emergent 3D x-ray diffraction microscopy (3DXRD) methods in capturing topological features, such as the grain boun...

Full description

Saved in:
Bibliographic Details
Main Authors: A. J. Shahani, D. Juul Jensen, Y. Zhang
Format: Article
Language:English
Published: Taylor & Francis Group 2025-07-01
Series:Materials Research Letters
Subjects:
Three-dimensional characterization
microanalysis
polycrystalline microstructure
grain boundaries
comparative topology
Online Access:https://www.tandfonline.com/doi/10.1080/21663831.2025.2517730
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://www.tandfonline.com/doi/10.1080/21663831.2025.2517730

Similar Items