Damage evolution of Cu-inductors used for electromagnetic forming
Abstract Electromagnetic forming (EMF) is a high-speed forming technology using the interactions of pulsed currents and magnetic fields to apply Lorentz forces to electrically conductive workpieces. The damage behavior of Cu-inductors used for EMF was investigated by electron microscopy, particularl...
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-08-01
|
| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-14135-4 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|