A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry

A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry

This article aims to complete a review of current literature describing the measurement and characterization of photoelectric and geometric properties of perovskite solar cell (PSC) film layer materials using the spectroscopic ellipsometry (SE) measurement technique. Firstly, the influence of film q...

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Bibliographic Details
Main Authors: Liyuan Ma, Xipeng Xu, Changcai Cui, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng
Format: Article
Language:English
Published: MDPI AG 2025-02-01
Series:Nanomaterials
Subjects:
perovskite solar cells
spectroscopic ellipsometry
film quality
photoelectric properties
geometrical properties
Online Access:https://www.mdpi.com/2079-4991/15/4/282
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