Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability

The advancement of miniaturizing electronic information technology draws growing interest in dielectric capacitors due to their high-power density and rapid charge/discharge capabilities. The sol-gel method was utilized to fabricate the 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub&g...

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Main Authors: Li Wu, Feifei Han, Kaiyuan Chen, Jianming Deng, Laijun Liu, Biaolin Peng
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Molecules
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Online Access:https://www.mdpi.com/1420-3049/30/1/8
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author Li Wu
Feifei Han
Kaiyuan Chen
Jianming Deng
Laijun Liu
Biaolin Peng
author_facet Li Wu
Feifei Han
Kaiyuan Chen
Jianming Deng
Laijun Liu
Biaolin Peng
author_sort Li Wu
collection DOAJ
description The advancement of miniaturizing electronic information technology draws growing interest in dielectric capacitors due to their high-power density and rapid charge/discharge capabilities. The sol-gel method was utilized to fabricate the 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> (PZT-25BFO) thin film. Excitingly, PZT-25BFO thin film exhibits an exceptional capacitive energy storage density (<i>W<sub>rec</sub></i> = 24.61–39.76 J/cm<sup>3</sup>) and a high efficiency (<i>η</i> = 53.78–72.74%). Furthermore, the dielectric energy storage density and efficiency enhance simultaneously with increasing thickness of the thin film. However, the loss factor shows the opposite trend. Specifically, the 12-layer PZT-25BFO thin film demonstrates the optimal properties, boasting a significant energy storage density (15.73 J/cm<sup>3</sup>), a high efficiency (77.65%), and remarkable thermal stability (±0.55% variation) from 303 K to 383 K at 1000 kV/cm. This excellent thermal stability can be attributed to the residual stress resulting from a phase transition from the rhombohedral to tetragonal phase. The result offers valuable guidance for the development of ferroelectric thin films in high-power capacitive energy storage applications.
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institution Kabale University
issn 1420-3049
language English
publishDate 2024-12-01
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series Molecules
spelling doaj-art-32cd6096810b4a5da8884c336535be262025-01-10T13:18:34ZengMDPI AGMolecules1420-30492024-12-01301810.3390/molecules30010008Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal StabilityLi Wu0Feifei Han1Kaiyuan Chen2Jianming Deng3Laijun Liu4Biaolin Peng5Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, ChinaGuangxi Key Laboratory of Calcium Carbonate Resources Comprehensive Utilization, College of Materials and Environmental Engineering, Hezhou University, Hezhou 542899, ChinaGuangxi Key Laboratory of Calcium Carbonate Resources Comprehensive Utilization, College of Materials and Environmental Engineering, Hezhou University, Hezhou 542899, ChinaGuangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, ChinaGuangxi Key Laboratory of Optical and Electronic Materials and Devices, Guilin University of Technology, Guilin 541004, ChinaSchool of Advanced Materials and Nanotechnology, Xidian University, Xi’an 710126, ChinaThe advancement of miniaturizing electronic information technology draws growing interest in dielectric capacitors due to their high-power density and rapid charge/discharge capabilities. The sol-gel method was utilized to fabricate the 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> (PZT-25BFO) thin film. Excitingly, PZT-25BFO thin film exhibits an exceptional capacitive energy storage density (<i>W<sub>rec</sub></i> = 24.61–39.76 J/cm<sup>3</sup>) and a high efficiency (<i>η</i> = 53.78–72.74%). Furthermore, the dielectric energy storage density and efficiency enhance simultaneously with increasing thickness of the thin film. However, the loss factor shows the opposite trend. Specifically, the 12-layer PZT-25BFO thin film demonstrates the optimal properties, boasting a significant energy storage density (15.73 J/cm<sup>3</sup>), a high efficiency (77.65%), and remarkable thermal stability (±0.55% variation) from 303 K to 383 K at 1000 kV/cm. This excellent thermal stability can be attributed to the residual stress resulting from a phase transition from the rhombohedral to tetragonal phase. The result offers valuable guidance for the development of ferroelectric thin films in high-power capacitive energy storage applications.https://www.mdpi.com/1420-3049/30/1/8PZTBFOenergy storagethermal stability
spellingShingle Li Wu
Feifei Han
Kaiyuan Chen
Jianming Deng
Laijun Liu
Biaolin Peng
Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
Molecules
PZT
BFO
energy storage
thermal stability
title Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
title_full Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
title_fullStr Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
title_full_unstemmed Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
title_short Synthesis of 0.75Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub>-0.25BiFeO<sub>3</sub> Thin Film Capacitors with Excellent Efficiency and Thermal Stability
title_sort synthesis of 0 75pb zr sub 0 52 sub ti sub 0 48 sub o sub 3 sub 0 25bifeo sub 3 sub thin film capacitors with excellent efficiency and thermal stability
topic PZT
BFO
energy storage
thermal stability
url https://www.mdpi.com/1420-3049/30/1/8
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