Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy

Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy

Objectives. The main aim of this review is to summarize the existing knowledge on the use of X-ray photoelectron spectroscopy (XPS) for the characterization of nanoparticles and nanomaterials.Results. XPS or electron spectroscopy for chemical analysis can provide information on the qualitative and q...

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Bibliographic Details
Main Authors:	A. A. Ischenko, M. A. Lazov, E. V. Mironova, A. Yu. Putin, A. M. Ionov, P. A. Storozhenko
Format:	Article
Language:	Russian
Published:	MIREA - Russian Technological University 2023-05-01
Series:	Тонкие химические технологии
Subjects:	x-ray photoelectron spectroscopy nanoparticles nanomaterials valence states of elements surface interfaces diffraction methods spectral methods
Online Access:	https://www.finechem-mirea.ru/jour/article/view/1955
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