Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy

Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy

Objectives. The main aim of this review is to summarize the existing knowledge on the use of X-ray photoelectron spectroscopy (XPS) for the characterization of nanoparticles and nanomaterials.Results. XPS or electron spectroscopy for chemical analysis can provide information on the qualitative and q...

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Bibliographic Details
Main Authors: A. A. Ischenko, M. A. Lazov, E. V. Mironova, A. Yu. Putin, A. M. Ionov, P. A. Storozhenko
Format: Article
Language:Russian
Published: MIREA - Russian Technological University 2023-05-01
Series:Тонкие химические технологии
Subjects:
x-ray photoelectron spectroscopy
nanoparticles
nanomaterials
valence states of elements
surface
interfaces
diffraction methods
spectral methods
Online Access:https://www.finechem-mirea.ru/jour/article/view/1955
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