The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection

The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection

High moisture content (MC) harms wheat storage quality and readily leads to mold growth. Accurate localization of abnormal/high-moisture regions enables early warning, ensuring proper storage and reducing economic losses. The present study introduces the 2D microwave scanning method and investigates...

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Bibliographic Details
Main Authors: Dong Dai, Zhenyu Wang, Hao Huang, Xu Mao, Yehong Liu, Hao Li, Du Chen
Format: Article
Language:English
Published: MDPI AG 2025-07-01
Series:Agriculture
Subjects:
microwave localizing method
wheat’s moisture content
abnormal moisture region
machine learning
microwave transmission
Online Access:https://www.mdpi.com/2077-0472/15/15/1649
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