Roughness-driven compressive sensing AFM for accurate nanoscale surface characterization in functional material systems
Surface roughness significantly affects the functional performance of advanced materials, necessitating accurate nanoscale characterization via Atomic Force Microscopy (AFM). However, AFM’s high sampling requirements prolong measurement time and accelerate probe wear. To enhance efficiency, compress...
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| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-08-01
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| Series: | Materials & Design |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0264127525007713 |
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