Roughness-driven compressive sensing AFM for accurate nanoscale surface characterization in functional material systems

Roughness-driven compressive sensing AFM for accurate nanoscale surface characterization in functional material systems

Surface roughness significantly affects the functional performance of advanced materials, necessitating accurate nanoscale characterization via Atomic Force Microscopy (AFM). However, AFM’s high sampling requirements prolong measurement time and accelerate probe wear. To enhance efficiency, compress...

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Bibliographic Details
Main Authors: Yusong Li, Jialin Shi, Gongxin Li, Shenghang Zhai, Xiao Li, Boyu Wu, Chanmin Su, Lianqing Liu
Format: Article
Language:English
Published: Elsevier 2025-08-01
Series:Materials & Design
Subjects:
Nanoscale surface roughness
Atomic force microscope (AFM)
Compressive sensing
Improved efficiency
High accuracy
Online Access:http://www.sciencedirect.com/science/article/pii/S0264127525007713
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