Evaluating the Local Bandgap Across inxGa1‐xas Multiple Quantum Wells in a Metamorphic Laser via Low‐Loss EELS
Abstract Using high‐resolution scanning transmission electron microscopy and low‐loss electron energy loss spectroscopy, the local bandgap (Eg), indium concentration, and strain distribution across multiple InxGa1‐xAs quantum wells (QWs), on a GaAs substrate, within a metamorphic laser structure are...
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| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2025-05-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202400897 |
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