A study on dynamic avalanche test of IGBT module

During the turn-off of IGBT modules, dynamic avalanche will occur when a large electric field is generated inside the chip. In this paper, an experimental scheme was designed and verified to analyze the effect of different factors on dynamic avalanche and the avalanche tolerance of IGBT module. The...

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Bibliographic Details
Main Authors: YU Wei, ZHENG Yu, YUAN Tao, REN Yadong
Format: Article
Language:zho
Published: Editorial Department of Electric Drive for Locomotives 2023-09-01
Series:机车电传动
Subjects:
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2023.05.015
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