APA (7th ed.) Citation

Marrakh, R., & Bouhdada, A. Modeling of Interface Defect Distribution for an n-MOSFETs Under Hot-Carrier Stressing. Wiley.

Chicago Style (17th ed.) Citation

Marrakh, R., and A. Bouhdada. Modeling of Interface Defect Distribution for an N-MOSFETs Under Hot-Carrier Stressing. Wiley.

MLA (9th ed.) Citation

Marrakh, R., and A. Bouhdada. Modeling of Interface Defect Distribution for an N-MOSFETs Under Hot-Carrier Stressing. Wiley.

Warning: These citations may not always be 100% accurate.