Design approach for lateral optimization of GaN CAVETs: A static characteristics study

This paper demonstrates a fabless design approach for the lateral optimization of a GaN current aperture vertical electron transistor (CAVET). To this end, the length of the current blocking layer (CBL) has been scaled to exhibit the influence of current aperture length on the static characteristics...

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Bibliographic Details
Main Authors: Ashrafun Naher Pinky, Thomas Ebel, Samaneh Sharbati
Format: Article
Language:English
Published: Elsevier 2025-03-01
Series:Power Electronic Devices and Components
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2772370424000208
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