Fully Automated Software Product Line Evolution With Diverse Artifacts
Existing approaches in software product lines usually neglect knowledge modeling and simulation of the interaction between features capable of bringing dynamism and automation. Consequently, these solutions miss opportunities to resolve associated and emerging problems, including defect detection or...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10877839/ |
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