New materials based on InP-ZnS system for semiconductor gas analyzers

According to the developed methodology, based on the isothermal diffusion of the initial binary compounds (InP, ZnS), their physical and physicochemical properties, solid solutions of different composition ((InP)x (ZnS)1-x) have been obtained. X-ray examinations have been conducted which allow...

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Main Authors: I. A. Kirovskaya, R. V. Ekkert, A. O. Ekkert, E. V. Mironova, I. Yu. Umansky, A. I. Blesman, D. A. Polonyankin, L. V. Kolesnikov, E. N. Kopylova, V. B. Goncharov
Format: Article
Language:English
Published: Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education 2019-04-01
Series:Омский научный вестник
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Online Access:https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2019/2%20(164)/56-61%20%D0%9A%D0%B8%D1%80%D0%BE%D0%B2%D1%81%D0%BA%D0%B0%D1%8F%20%D0%98.%20%D0%90.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%A0.%20%D0%92.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%90.%20%D0%9E.%20%D0%B8%20%D0%B4%D1%80..pdf
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author I. A. Kirovskaya
R. V. Ekkert
A. O. Ekkert
E. V. Mironova
I. Yu. Umansky
A. I. Blesman
D. A. Polonyankin
L. V. Kolesnikov
E. N. Kopylova
V. B. Goncharov
author_facet I. A. Kirovskaya
R. V. Ekkert
A. O. Ekkert
E. V. Mironova
I. Yu. Umansky
A. I. Blesman
D. A. Polonyankin
L. V. Kolesnikov
E. N. Kopylova
V. B. Goncharov
author_sort I. A. Kirovskaya
collection DOAJ
description According to the developed methodology, based on the isothermal diffusion of the initial binary compounds (InP, ZnS), their physical and physicochemical properties, solid solutions of different composition ((InP)x (ZnS)1-x) have been obtained. X-ray examinations have been conducted which allows to certify them as substitution solid solution with sphalerite structure and acid-base properties studies (pH isoelectric state — pHISO). The consistent patterns of changes in the composition of the studied (bulk and surface) properties, which are of predominantly smooth nature, have been established. A correlation between theoretical calculated crystal density and acid sites strength (pHISO) has been found which served as the basis for recommending a less labour-consuming way to search for the advanced materials for semiconductor gas analyzers.
format Article
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institution Kabale University
issn 1813-8225
2541-7541
language English
publishDate 2019-04-01
publisher Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
record_format Article
series Омский научный вестник
spelling doaj-art-2a62cbd6fb6241c180b38cc7ffb4a1f42025-02-03T00:49:17ZengOmsk State Technical University, Federal State Autonoumos Educational Institution of Higher EducationОмский научный вестник1813-82252541-75412019-04-012 (164)566110.25206/1813-8225-2019-164-56-61New materials based on InP-ZnS system for semiconductor gas analyzersI. A. Kirovskaya0https://orcid.org/0000-0001-5926-8376R. V. Ekkert1https://orcid.org/0000-0003-4358-3421A. O. Ekkert2https://orcid.org/0000-0003-2452-1612E. V. Mironova3I. Yu. Umansky4A. I. Blesman5https://orcid.org/0000-0003-2837-3469D. A. Polonyankin6https://orcid.org/0000-0001-6799-3105L. V. Kolesnikov7E. N. Kopylova8V. B. Goncharov9https://orcid.org/0000-0003-4575-1310Omsk State Technical UniversityOmsk State Technical UniversityOmsk State Technical UniversityOmsk State Technical UniversityOmsk State Technical UniversityOmsk State Technical UniversityOmsk State Technical UniversityKemerovo State UniversityOmsk State Technical UniversityFederal Research Center Boreskov Institute of Catalysis Siberian Branch of Russian Academy of ScienceAccording to the developed methodology, based on the isothermal diffusion of the initial binary compounds (InP, ZnS), their physical and physicochemical properties, solid solutions of different composition ((InP)x (ZnS)1-x) have been obtained. X-ray examinations have been conducted which allows to certify them as substitution solid solution with sphalerite structure and acid-base properties studies (pH isoelectric state — pHISO). The consistent patterns of changes in the composition of the studied (bulk and surface) properties, which are of predominantly smooth nature, have been established. A correlation between theoretical calculated crystal density and acid sites strength (pHISO) has been found which served as the basis for recommending a less labour-consuming way to search for the advanced materials for semiconductor gas analyzers.https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2019/2%20(164)/56-61%20%D0%9A%D0%B8%D1%80%D0%BE%D0%B2%D1%81%D0%BA%D0%B0%D1%8F%20%D0%98.%20%D0%90.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%A0.%20%D0%92.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%90.%20%D0%9E.%20%D0%B8%20%D0%B4%D1%80..pdfsolid solutionsadvanced materialsnew materials propertiesconsistent patterns and correlationssemiconductor gas analyzers
spellingShingle I. A. Kirovskaya
R. V. Ekkert
A. O. Ekkert
E. V. Mironova
I. Yu. Umansky
A. I. Blesman
D. A. Polonyankin
L. V. Kolesnikov
E. N. Kopylova
V. B. Goncharov
New materials based on InP-ZnS system for semiconductor gas analyzers
Омский научный вестник
solid solutions
advanced materials
new materials properties
consistent patterns and correlations
semiconductor gas analyzers
title New materials based on InP-ZnS system for semiconductor gas analyzers
title_full New materials based on InP-ZnS system for semiconductor gas analyzers
title_fullStr New materials based on InP-ZnS system for semiconductor gas analyzers
title_full_unstemmed New materials based on InP-ZnS system for semiconductor gas analyzers
title_short New materials based on InP-ZnS system for semiconductor gas analyzers
title_sort new materials based on inp zns system for semiconductor gas analyzers
topic solid solutions
advanced materials
new materials properties
consistent patterns and correlations
semiconductor gas analyzers
url https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2019/2%20(164)/56-61%20%D0%9A%D0%B8%D1%80%D0%BE%D0%B2%D1%81%D0%BA%D0%B0%D1%8F%20%D0%98.%20%D0%90.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%A0.%20%D0%92.,%20%D0%AD%D0%BA%D0%BA%D0%B5%D1%80%D1%82%20%D0%90.%20%D0%9E.%20%D0%B8%20%D0%B4%D1%80..pdf
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