Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes

The objective of this study is to study, design, and develop a high-speed PIN photodiode based on In<sub>x</sub>Ga <sub>1-x</sub>N&#x002F;GaN alloys deposited by metal&#x2013;organic chemical vapor deposition. The configuration used for the PIN photodiode is based on...

Full description

Saved in:
Bibliographic Details
Main Authors: Bandar Alshehri, Karim Dogheche, Sofiane Belahsene, Abderrahim Ramdane, Gilles Patriarche, Didier Decoster, Elhadj Dogheche
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7945255/
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1849417595889909760
author Bandar Alshehri
Karim Dogheche
Sofiane Belahsene
Abderrahim Ramdane
Gilles Patriarche
Didier Decoster
Elhadj Dogheche
author_facet Bandar Alshehri
Karim Dogheche
Sofiane Belahsene
Abderrahim Ramdane
Gilles Patriarche
Didier Decoster
Elhadj Dogheche
author_sort Bandar Alshehri
collection DOAJ
description The objective of this study is to study, design, and develop a high-speed PIN photodiode based on In<sub>x</sub>Ga <sub>1-x</sub>N&#x002F;GaN alloys deposited by metal&#x2013;organic chemical vapor deposition. The configuration used for the PIN photodiode is based on an absorbing layer composed of In<sub>0.1</sub>Ga<sub>0.9</sub>N multiple quantum wells. Structural, microstructural, and optical analyses have been carried out using TEM, PL, and absorption measurement. The design of PIN structures varies with an active surface ranging from <inline-formula> <tex-math notation="LaTeX">$10^{4}\,{\rm{to\,10}}^{6}\,{\rm{\mu m}}^{2}$</tex-math></inline-formula>. Static and dynamic characterizations have been performed to qualify the photodiode response. A photocurrent value reaching a maximum of 1.2 mA is reported for a diode of <inline-formula><tex-math notation="LaTeX">${\rm{100\times 100\,\mathrm{\mu} m}}^{2}$</tex-math></inline-formula> area, with an external quantum efficiency of 13&#x0025;. Using the noise measurement technique, the device reveals a &#x2212;3-dB cutoff frequency of 300 MHz for the same photodiode. This result clearly shows the potential of III-nitride materials for targeting high-speed optoelectronics. The future prospect is to work toward InGaN-based microphotodiodes in order to achieve optical transmission links in the UV-visible range using the same material system.
format Article
id doaj-art-2906d097a9ab48358751d00bc6a89c3c
institution Kabale University
issn 1943-0655
language English
publishDate 2017-01-01
publisher IEEE
record_format Article
series IEEE Photonics Journal
spelling doaj-art-2906d097a9ab48358751d00bc6a89c3c2025-08-20T03:32:46ZengIEEEIEEE Photonics Journal1943-06552017-01-01941710.1109/JPHOT.2017.27141687945255Dynamic Characterization of III-Nitride-Based High-Speed PhotodiodesBandar Alshehri0Karim Dogheche1Sofiane Belahsene2Abderrahim Ramdane3Gilles Patriarche4Didier Decoster5Elhadj Dogheche6Institute of Electronics, Microelectronics & Nanotechnology, Optoelectronics Group (IEMN CNRS UMR 8520), Villeneuve d&#x0027;ascq, FranceInstitute of Electronics, Microelectronics & Nanotechnology, Optoelectronics Group (IEMN CNRS UMR 8520), Villeneuve d&#x0027;ascq, FranceC2N, Centre for Nanoscience and Nanotechnology, CNRS, Route de Nozay, Marcoussis, FranceC2N, Centre for Nanoscience and Nanotechnology, CNRS, Route de Nozay, Marcoussis, FranceC2N, Centre for Nanoscience and Nanotechnology, CNRS, Route de Nozay, Marcoussis, FranceInstitute of Electronics, Microelectronics & Nanotechnology, Optoelectronics Group (IEMN CNRS UMR 8520), Villeneuve d&#x0027;ascq, FranceInstitute of Electronics, Microelectronics & Nanotechnology, Optoelectronics Group (IEMN CNRS UMR 8520), Villeneuve d&#x0027;ascq, FranceThe objective of this study is to study, design, and develop a high-speed PIN photodiode based on In<sub>x</sub>Ga <sub>1-x</sub>N&#x002F;GaN alloys deposited by metal&#x2013;organic chemical vapor deposition. The configuration used for the PIN photodiode is based on an absorbing layer composed of In<sub>0.1</sub>Ga<sub>0.9</sub>N multiple quantum wells. Structural, microstructural, and optical analyses have been carried out using TEM, PL, and absorption measurement. The design of PIN structures varies with an active surface ranging from <inline-formula> <tex-math notation="LaTeX">$10^{4}\,{\rm{to\,10}}^{6}\,{\rm{\mu m}}^{2}$</tex-math></inline-formula>. Static and dynamic characterizations have been performed to qualify the photodiode response. A photocurrent value reaching a maximum of 1.2 mA is reported for a diode of <inline-formula><tex-math notation="LaTeX">${\rm{100\times 100\,\mathrm{\mu} m}}^{2}$</tex-math></inline-formula> area, with an external quantum efficiency of 13&#x0025;. Using the noise measurement technique, the device reveals a &#x2212;3-dB cutoff frequency of 300 MHz for the same photodiode. This result clearly shows the potential of III-nitride materials for targeting high-speed optoelectronics. The future prospect is to work toward InGaN-based microphotodiodes in order to achieve optical transmission links in the UV-visible range using the same material system.https://ieeexplore.ieee.org/document/7945255/PhotodetectorsGaNbandwidthfabrication and characterization
spellingShingle Bandar Alshehri
Karim Dogheche
Sofiane Belahsene
Abderrahim Ramdane
Gilles Patriarche
Didier Decoster
Elhadj Dogheche
Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
IEEE Photonics Journal
Photodetectors
GaN
bandwidth
fabrication and characterization
title Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
title_full Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
title_fullStr Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
title_full_unstemmed Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
title_short Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes
title_sort dynamic characterization of iii nitride based high speed photodiodes
topic Photodetectors
GaN
bandwidth
fabrication and characterization
url https://ieeexplore.ieee.org/document/7945255/
work_keys_str_mv AT bandaralshehri dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT karimdogheche dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT sofianebelahsene dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT abderrahimramdane dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT gillespatriarche dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT didierdecoster dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes
AT elhadjdogheche dynamiccharacterizationofiiinitridebasedhighspeedphotodiodes