Detection and segmentation framework for defect detection on multi-layer ceramic capacitors

Detecting defective multi-layer ceramic capacitors (MLCCs) during the inspection stage is a crucial production task to effectively manage production yield and maintain quality. However, this task presents two challenges: the necessity of pixel-level segmentation in high-resolution images and unexplo...

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Bibliographic Details
Main Authors: Hyun-Jae Kim, Sung-Bin Son, Heung-Seon Oh
Format: Article
Language:English
Published: Electronics and Telecommunications Research Institute (ETRI) 2025-08-01
Series:ETRI Journal
Subjects:
Online Access:https://doi.org/10.4218/etrij.2024-0066
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