Parallax-Tolerant Weakly-Supervised Pixel-Wise Deep Color Correction for Image Stitching of Pinhole Camera Arrays

Parallax-Tolerant Weakly-Supervised Pixel-Wise Deep Color Correction for Image Stitching of Pinhole Camera Arrays

Camera arrays typically use image-stitching algorithms to generate wide field-of-view panoramas, but parallax and color differences caused by varying viewing angles often result in noticeable artifacts in the stitching result. However, existing solutions can only address specific color difference is...

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Bibliographic Details
Main Authors: Yanzheng Zhang, Kun Gao, Zhijia Yang, Chenrui Li, Mingfeng Cai, Yuexin Tian, Haobo Cheng, Zhenyu Zhu
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Sensors
Subjects:
artifact elimination
color correction
image stitching
parallax
pinhole camera arrays
Online Access:https://www.mdpi.com/1424-8220/25/3/732
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