A SEM-X-Ray assisted experimental approach for the determination of mechanical and thermal load � induced damage in MMCs

An experimental technique is presented to evaluate mechanical and thermal load-induced microstructural damage, based on the Electron Probe Micro-Analysis (EPMA) principle, by which certain ana¬lyti¬cal potentialities of Scanning Electron Micro¬scopy (SEM) are used. The aim of the study is to apply t...

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Bibliographic Details
Main Authors: Victor N. Kytopoulos, Emilios Sideridis, John Venetis, Chrysoula Riga, Alexandros Altzoumailis
Format: Article
Language:English
Published: Gruppo Italiano Frattura 2019-10-01
Series:Fracture and Structural Integrity
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Online Access:https://www.fracturae.com/index.php/fis/article/view/2610/2747
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