XPS study and electronic structure of non-doped and Cr+ ion implanted CuO thin films

XPS study and electronic structure of non-doped and Cr+ ion implanted CuO thin films

Abstract CuO is a p-type semiconductor that can be found useful in various applications, sensing, photocatalysis or photovoltaics. Better material performance can be achieved by doping. In our study the doping was done using Cr ions and implantation method. Thin film samples were characterised with...

Full description

Saved in:
Bibliographic Details
Main Authors: Katarzyna Ungeheuer, Amelia E. Bocirnea, Konstanty W. Marszalek, Waldemar Tokarz, Denis A. Pikulski, Zbigniew Kąkol, Aurelian C. Galca
Format: Article
Language:English
Published: Nature Portfolio 2025-07-01
Series:Scientific Reports
Subjects:
DFT
Ion implantation
Thin films
Electronic structure
Copper oxide CuO
XPS
Online Access:https://doi.org/10.1038/s41598-025-08421-4
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://doi.org/10.1038/s41598-025-08421-4

Similar Items