Transmission Line Model Measurements of Metal-Semiconductor Contacts

The intriguing aspect of the research involves acquiring experimental results related to engineering processes at low temperatures. One could mention the demonstrated relationship between the manufacturing method and the enhancement of the metallic component's quality by reducing the resistance...

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Bibliographic Details
Main Authors: M.M. Musztyfaga-Staszuk, P. Panek, A. Czupryński, C. Mele
Format: Article
Language:English
Published: Polish Academy of Sciences 2002-02-01
Series:Archives of Foundry Engineering
Subjects:
Online Access:https://journals.pan.pl/Content/134142/PDF/AFE%201_2025_05-Final.pdf
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