Nanoscale thermal transport at metal-semiconductor interfaces: size-dependent exponential scaling

As semiconductor manufacturing advances towards the sub-3 nm regime, understanding interfacial thermal transport becomes increasingly critical due to scaling-induced challenges in heat dissipation and material integration. In this study, we investigate nanoscale thermal transport at the copper/silic...

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Bibliographic Details
Main Authors: M Zeeshan Siddique, Jaber Al Hossain, BoHung Kim
Format: Article
Language:English
Published: Elsevier 2025-09-01
Series:Results in Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590123025026994
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