High-resolution correlative imaging in ultrafast electron microscopy
Ultrafast electron microscopy (UEM) has a broad scope of application across material systems and scientific disciplines. In UEM, we investigate multiscale dynamics in the spatial domain ranging from micrometres to ångströms, in reciprocal space, and on timescales from microseconds to attoseconds, wi...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2024-12-01
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| Series: | Advances in Physics: X |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/23746149.2024.2316710 |
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