Predicting Scattering From Complex Nano-Structures via Deep Learning

Existing numerical electromagnetic (EM) solvers are usually computationally expensive, time consuming, and memory demanding. Recent advances in deep learning (DL) techniques have demonstrated superior efficiency and provide an alternative pathway for speeding up simulations by serving as effective c...

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Bibliographic Details
Main Authors: Yongzhong Li, Yinpeng Wang, Shutong Qi, Qiang Ren, Lei Kang, Sawyer D. Campbell, Pingjuan L. Werner, Douglas H. Werner
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9149921/
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