Aberration Effects of Planar Layers in Near-Field Multistatic Millimeter-Wave Imaging
This paper presents the analysis on the effects of aberration induced by planar layers in the near-field millimeter-wave imaging. A point spread function (PSF) simulator, based on the matched filtering method combined with ray tracing technique, is introduced to quantitatively investigate the effect...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10935608/ |
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