A Simulation Study of Single Event Burnout (SEB) in a High-Voltage Pin Diode
Exposure to ionizing radiation in space can potentially destroy electronic devices due to single-event effects (SEEs). Developing modern space technology requires high-voltage devices to supply the increased electric power demand. A widely recognized problem for power electronic devices in space is...
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| Format: | Article |
| Language: | fas |
| Published: |
Aerospace Research Institute
2024-08-01
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| Series: | فصلنامه علوم و فناوری فضایی |
| Subjects: | |
| Online Access: | https://jsst.ias.ir/article_198717_4b53cd4520fe9ec157e45a26004e70f4.pdf |
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