First study of single-event burnout in very-thin planar silicon sensors

First study of single-event burnout in very-thin planar silicon sensors

This paper investigates the single-event burnout (SEB) effect in thin irradiated positive-intrinsic-negative (PiN) diodes and low-gain avalanche diodes (LGAD). SEB is a destructive event triggered in silicon sensors by the passage of a high-momentum charged particle. This effect arises in planar sen...

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Bibliographic Details
Main Authors: Marco Ferrero, Roberta Arcidiacono, Nicolò Cartiglia, Leonardo Lanteri, Luca Menzio, Arianna Morozzi, Francesco Moscatelli, Roberto Mulargia, Federico Siviero, Robert White, Valentina Sola
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-05-01
Series:Frontiers in Physics
Subjects:
single-event burnout
SEB
thin silicon sensors
PiN
LGAD
Online Access:https://www.frontiersin.org/articles/10.3389/fphy.2025.1575672/full
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https://www.frontiersin.org/articles/10.3389/fphy.2025.1575672/full

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