A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL
The high-energy-resolution X-ray emission spectroscopy (XES) spectrometers available at the Femtosecond X-ray Experiment (FXE) instrument of the European XFEL operate in Bragg (reflective) geometry, with optimum performance in the range between 5 and 15 keV. However, they quickly lose efficiency abo...
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International Union of Crystallography
2025-05-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577525001389 |
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| author | X. Huang Y. Uemura F. Ardana-Lamas P. Frankenberger M. Knoll H. Yousef H. Wang S. Heder M. Nachtegaal G. Smolentsev L. Wang L. F. Zhu C. Milne F.A. Lima |
| author_facet | X. Huang Y. Uemura F. Ardana-Lamas P. Frankenberger M. Knoll H. Yousef H. Wang S. Heder M. Nachtegaal G. Smolentsev L. Wang L. F. Zhu C. Milne F.A. Lima |
| author_sort | X. Huang |
| collection | DOAJ |
| description | The high-energy-resolution X-ray emission spectroscopy (XES) spectrometers available at the Femtosecond X-ray Experiment (FXE) instrument of the European XFEL operate in Bragg (reflective) geometry, with optimum performance in the range between 5 and 15 keV. However, they quickly lose efficiency above around 15 keV due to the decrease in reflectivity of the crystal analyzers at such high photon energies. This hampers high-energy-resolution spectroscopy experiments on heavy elements (e.g. 4d metals), which thus do not fully profit from the high-photon-energy capabilities of the European XFEL. Here we present the design, implementation and performance of a novel high-resolution XES spectrometer operating in Laue (transmission) geometry optimized for measurements at high photon energies (>15 keV). The High-Energy Laue X-ray emIssiOn Spectrometer (HELIOS) operates mainly in dispersive mode by placing the crystal analyzer inside or outside the Rowland circle. The Laue spectrometer performance in terms of energy resolution and efficiency is presented and discussed. Two Laue analyzers, silicon and quartz, have been tested at SuperXAS of the Swiss Light Source and at FXE of the European XFEL. The quartz analyzer was found to be about 2.7 times more efficient than the silicon one. The Laue spectrometer energy resolution (ΔE/E) reached at the FXE instrument is around 1.2 × 10−4. Depending on different user requests, the resolution can be further increased by using higher diffraction orders. The new Laue spectrometer increases the existing portfolio of XES spectrometers at FXE, enabling efficient implementation of ultrafast X-ray spectroscopies with high energy resolution at photon energies above 15 keV. This spectrometer will allow the expansion of studies in the field of ultrafast sciences, particularly including investigation of 4d elements using hard X-rays. |
| format | Article |
| id | doaj-art-1ff42be0bda143e7bf262b0c2a40d834 |
| institution | DOAJ |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-05-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-1ff42be0bda143e7bf262b0c2a40d8342025-08-20T03:09:29ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-05-0132350652310.1107/S1600577525001389ok5135A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFELX. Huang0Y. Uemura1F. Ardana-Lamas2P. Frankenberger3M. Knoll4H. Yousef5H. Wang6S. Heder7M. Nachtegaal8G. Smolentsev9L. Wang10L. F. Zhu11C. Milne12F.A. Lima13European XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyCenter for Energy and Environmental Sciences, Paul Scherrer Institute, CH-5232 Villigen, SwitzerlandCenter for Energy and Environmental Sciences, Paul Scherrer Institute, CH-5232 Villigen, SwitzerlandDepartment of Modern Physics, University of Science and Technology of China, 230026 Hefei, People's Republic of ChinaDepartment of Modern Physics, University of Science and Technology of China, 230026 Hefei, People's Republic of ChinaEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyThe high-energy-resolution X-ray emission spectroscopy (XES) spectrometers available at the Femtosecond X-ray Experiment (FXE) instrument of the European XFEL operate in Bragg (reflective) geometry, with optimum performance in the range between 5 and 15 keV. However, they quickly lose efficiency above around 15 keV due to the decrease in reflectivity of the crystal analyzers at such high photon energies. This hampers high-energy-resolution spectroscopy experiments on heavy elements (e.g. 4d metals), which thus do not fully profit from the high-photon-energy capabilities of the European XFEL. Here we present the design, implementation and performance of a novel high-resolution XES spectrometer operating in Laue (transmission) geometry optimized for measurements at high photon energies (>15 keV). The High-Energy Laue X-ray emIssiOn Spectrometer (HELIOS) operates mainly in dispersive mode by placing the crystal analyzer inside or outside the Rowland circle. The Laue spectrometer performance in terms of energy resolution and efficiency is presented and discussed. Two Laue analyzers, silicon and quartz, have been tested at SuperXAS of the Swiss Light Source and at FXE of the European XFEL. The quartz analyzer was found to be about 2.7 times more efficient than the silicon one. The Laue spectrometer energy resolution (ΔE/E) reached at the FXE instrument is around 1.2 × 10−4. Depending on different user requests, the resolution can be further increased by using higher diffraction orders. The new Laue spectrometer increases the existing portfolio of XES spectrometers at FXE, enabling efficient implementation of ultrafast X-ray spectroscopies with high energy resolution at photon energies above 15 keV. This spectrometer will allow the expansion of studies in the field of ultrafast sciences, particularly including investigation of 4d elements using hard X-rays.https://journals.iucr.org/paper?S1600577525001389x-ray free-electron lasersx-ray spectrometersx-ray emission spectroscopydumond geometryultrafast sciencelaue crystal analyzers |
| spellingShingle | X. Huang Y. Uemura F. Ardana-Lamas P. Frankenberger M. Knoll H. Yousef H. Wang S. Heder M. Nachtegaal G. Smolentsev L. Wang L. F. Zhu C. Milne F.A. Lima A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL Journal of Synchrotron Radiation x-ray free-electron lasers x-ray spectrometers x-ray emission spectroscopy dumond geometry ultrafast science laue crystal analyzers |
| title | A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL |
| title_full | A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL |
| title_fullStr | A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL |
| title_full_unstemmed | A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL |
| title_short | A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL |
| title_sort | high energy laue x ray emission spectrometer at the fxe instrument at the european xfel |
| topic | x-ray free-electron lasers x-ray spectrometers x-ray emission spectroscopy dumond geometry ultrafast science laue crystal analyzers |
| url | https://journals.iucr.org/paper?S1600577525001389 |
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