A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL

A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL

The high-energy-resolution X-ray emission spectroscopy (XES) spectrometers available at the Femtosecond X-ray Experiment (FXE) instrument of the European XFEL operate in Bragg (reflective) geometry, with optimum performance in the range between 5 and 15 keV. However, they quickly lose efficiency abo...

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Bibliographic Details
Main Authors: X. Huang, Y. Uemura, F. Ardana-Lamas, P. Frankenberger, M. Knoll, H. Yousef, H. Wang, S. Heder, M. Nachtegaal, G. Smolentsev, L. Wang, L. F. Zhu, C. Milne, F.A. Lima
Format: Article
Language:English
Published: International Union of Crystallography 2025-05-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray free-electron lasers
x-ray spectrometers
x-ray emission spectroscopy
dumond geometry
ultrafast science
laue crystal analyzers
Online Access:https://journals.iucr.org/paper?S1600577525001389
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