Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach
We describe a Bayesian estimation approach to infer on the frequency noise characteristics of narrow-linewidth semiconductor lasers from delayed self-heterodyne beat note measurements. Our technique is grounded in a statistical model of the measurement process that accounts for both the impact of th...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10491288/ |
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