Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach

Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach

We describe a Bayesian estimation approach to infer on the frequency noise characteristics of narrow-linewidth semiconductor lasers from delayed self-heterodyne beat note measurements. Our technique is grounded in a statistical model of the measurement process that accounts for both the impact of th...

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Bibliographic Details
Main Authors: Lutz Mertenskotter, Markus Kantner
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Photonics Journal
Subjects:
Laser linewidth
phase noise
self-heterodyne beat note measurement
Bayesian inference
spectral analysis
Online Access:https://ieeexplore.ieee.org/document/10491288/
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