Study on the Fourier Defects of Cone-Beam Computed Laminography
Cone-beam computed laminography (CBCL) is widely used in non-destructive testing of plate-like samples due to flexible scanning geometry and fine image details. However, the Fourier domain defects lead to superimposed artifacts, which significantly degrade the image quality. This paper aims to asses...
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IEEE
2025-01-01
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| Online Access: | https://ieeexplore.ieee.org/document/10909656/ |
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| author | Ji Pengxiang Hu Xiaodong Zou Jing |
| author_facet | Ji Pengxiang Hu Xiaodong Zou Jing |
| author_sort | Ji Pengxiang |
| collection | DOAJ |
| description | Cone-beam computed laminography (CBCL) is widely used in non-destructive testing of plate-like samples due to flexible scanning geometry and fine image details. However, the Fourier domain defects lead to superimposed artifacts, which significantly degrade the image quality. This paper aims to assess the data distribution of CBCL projections in the Fourier domain, and to precisely delineate the Fourier defective volume. We derive the mapping scheme from CBCL projections to the Fourier domain using the Generalized Fourier Slice Theorem. Then, practical defect delineation methods are proposed for the cases of CBCL global scanning (i.e., non-truncated projections) and local scanning (i.e., truncated projections). Simulation experiments have been conducted to validate the proposed methods, indicating that the data incompleteness of CBCL is related not only to the scanning parameters but also to the shape and orientation of the object. Moreover, a de-artifacting algorithm based on Fourier priori information has been preliminarily implemented, which shows huge potential in efficiency and image quality over conventional SART-based algorithms. |
| format | Article |
| id | doaj-art-1965368b4ac7437f9505ed4449ee200c |
| institution | DOAJ |
| issn | 2169-3536 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-1965368b4ac7437f9505ed4449ee200c2025-08-20T02:56:47ZengIEEEIEEE Access2169-35362025-01-0113427334274310.1109/ACCESS.2025.354772710909656Study on the Fourier Defects of Cone-Beam Computed LaminographyJi Pengxiang0Hu Xiaodong1https://orcid.org/0000-0001-7978-5485Zou Jing2https://orcid.org/0000-0002-4553-2743State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, ChinaState Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, ChinaState Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, ChinaCone-beam computed laminography (CBCL) is widely used in non-destructive testing of plate-like samples due to flexible scanning geometry and fine image details. However, the Fourier domain defects lead to superimposed artifacts, which significantly degrade the image quality. This paper aims to assess the data distribution of CBCL projections in the Fourier domain, and to precisely delineate the Fourier defective volume. We derive the mapping scheme from CBCL projections to the Fourier domain using the Generalized Fourier Slice Theorem. Then, practical defect delineation methods are proposed for the cases of CBCL global scanning (i.e., non-truncated projections) and local scanning (i.e., truncated projections). Simulation experiments have been conducted to validate the proposed methods, indicating that the data incompleteness of CBCL is related not only to the scanning parameters but also to the shape and orientation of the object. Moreover, a de-artifacting algorithm based on Fourier priori information has been preliminarily implemented, which shows huge potential in efficiency and image quality over conventional SART-based algorithms.https://ieeexplore.ieee.org/document/10909656/Computed tomographyimage reconstructionFourier domain |
| spellingShingle | Ji Pengxiang Hu Xiaodong Zou Jing Study on the Fourier Defects of Cone-Beam Computed Laminography IEEE Access Computed tomography image reconstruction Fourier domain |
| title | Study on the Fourier Defects of Cone-Beam Computed Laminography |
| title_full | Study on the Fourier Defects of Cone-Beam Computed Laminography |
| title_fullStr | Study on the Fourier Defects of Cone-Beam Computed Laminography |
| title_full_unstemmed | Study on the Fourier Defects of Cone-Beam Computed Laminography |
| title_short | Study on the Fourier Defects of Cone-Beam Computed Laminography |
| title_sort | study on the fourier defects of cone beam computed laminography |
| topic | Computed tomography image reconstruction Fourier domain |
| url | https://ieeexplore.ieee.org/document/10909656/ |
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