Study on the Fourier Defects of Cone-Beam Computed Laminography
Cone-beam computed laminography (CBCL) is widely used in non-destructive testing of plate-like samples due to flexible scanning geometry and fine image details. However, the Fourier domain defects lead to superimposed artifacts, which significantly degrade the image quality. This paper aims to asses...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10909656/ |
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