Diehle, P., Gierth, S., Lejoyeux, M., Geens, K., Borga, M., & Altmann, F. Doping investigation of structured GaN devices by highly lateral resolved TOF-SIMS. Elsevier.
Chicago Style (17th ed.) CitationDiehle, Patrick, Stephan Gierth, Mickael Lejoyeux, Karen Geens, Matteo Borga, and Frank Altmann. Doping Investigation of Structured GaN Devices by Highly Lateral Resolved TOF-SIMS. Elsevier.
MLA (9th ed.) CitationDiehle, Patrick, et al. Doping Investigation of Structured GaN Devices by Highly Lateral Resolved TOF-SIMS. Elsevier.
Warning: These citations may not always be 100% accurate.