Multi-Modal Dynamic Fusion for Defect Detection in Electronic Products: A Novel Approach Based on Energy and Deep Learning

As electronic products continue to evolve in complexity, maintaining stringent quality standards during manufacturing presents mounting challenges. Conventional defect detection approaches, which typically depend on a single modality, often fall short in both efficiency and reliability. To address t...

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Bibliographic Details
Main Authors: Yulin Liu, Yang Gao
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/11062584/
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