Emerging Copper-to-Copper Bonding Techniques: Enabling High-Density Interconnects for Heterogeneous Integration

As CMOS technology continues to downsize to the nanometer range, the exponential growth predicted by Moore’s Law has been significantly decelerated. Doubling chip density in the two-dimensional domain will no longer be feasible without further device downsizing. Meanwhile, emerging new device techno...

Full description

Saved in:
Bibliographic Details
Main Authors: Wenhan Bao, Jieqiong Zhang, Hei Wong, Jun Liu, Weidong Li
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/15/10/729
Tags: Add Tag
No Tags, Be the first to tag this record!