Advancing Corn Yield Mapping in Kenya Through Transfer Learning
Crop yield mapping is essential for food security and policy making. Recent machine learning (ML) and deep learning (DL) methods have achieved impressive accuracy in crop yield estimation. However, these models require numerous training samples that are scarce in regions with underdeveloped infrastr...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-05-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-4292/17/10/1717 |
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