Unsupervised selective labeling for semi-supervised industrial defect detection

In industrial detection scenarios, achieving high accuracy typically relies on extensive labeled datasets, which are costly and time-consuming. This has motivated a shift towards semi-supervised learning (SSL), which leverages labeled and unlabeled data to improve learning efficiency and reduce anno...

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Bibliographic Details
Main Authors: Jian Ge, Qin Qin, Shaojing Song, Jinhua Jiang, Zhiwei Shen
Format: Article
Language:English
Published: Springer 2024-10-01
Series:Journal of King Saud University: Computer and Information Sciences
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S1319157824002684
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